发明名称 INTEGRATED AND RELEASED BEAM LAYER STRUCTURE MANUFACTURED IN TRENCH AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an integrated and released beam layer structure manufactured in a trench and its manufacturing method. SOLUTION: The beam layer structure has a semiconductor substrate 20, the trench 18, a first electrical conducting layer 24, and the beam 28. The trench is extended inside the semiconductor substrate and has a wall. The first electrical conducting layer is positioned on the wall of the trench in the selected position. The beam is positioned on the trench, and the first part of it is connected to the semiconductor substrate, and a second part of it is movable. The second part of the beam is separated from the wall of the trench by the selected distance. Therefore, the second part of the beam is freely movable inside the plane vertical or parallel to the surface of the substrate, and can be deflected, that is, deformed relative to the trench so as to electrically contact in response to a predetermined acceleration force applied to the beam structure or the change of a predetermined temperature. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005169616(A) 申请公布日期 2005.06.30
申请号 JP20040340417 申请日期 2004.11.25
申请人 STMICROELECTRONICS INC 发明人 BLANCHARD RICHARD A;MCALEXANDER JOSEPH C
分类号 G01P15/135;B81B3/00;B81C1/00;G01K5/62;G01P15/18;(IPC1-7):B81B3/00 主分类号 G01P15/135
代理机构 代理人
主权项
地址