发明名称 Semiconductor device having MOS varactor and methods for fabricating the same
摘要 In a method for manufacturing a semiconductor device, a gate electrode is formed in a first region. A silicide blocking layer is patterned such that a first gate spacer is formed on sidewalls of the gate electrode, and a silicide blocking layer pattern is formed in a second region. A lightly doped source/drain region is formed on surface of the first region. A second gate spacer is formed on sidewalls of the first gate spacer. A heavily doped source/drain region is formed on the surface of the first region. A silicide layer is formed on the gate electrode and the heavily doped source/drain region in the first region.
申请公布号 US2005142779(A1) 申请公布日期 2005.06.30
申请号 US20040023623 申请日期 2004.12.29
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 CHEONG KONG-SOO;YOUN KI-SEOG;KIM KYUNG-SOO
分类号 H01L21/336;H01L27/06;(IPC1-7):H01L21/336 主分类号 H01L21/336
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