发明名称 Lockable retractable locating frame of a BGA on-top test socket
摘要 A lockable retractable locating frame of a BGA on-top test socket includes a push-and-lock mechanism that further comprises an accommodation room, a slider, and a sliding slot for riding the slider. The slider further includes a driving portion for receiving foreign input, a tongue portion nested in the accommodation room for protruding into a stroke space formed between the retractable locating frame and a base of the test socket, and a connection portion bridging the driving portion and the tongue portion for forming a slide pair with the sliding slot. By protruding the tongue portion into the stroke space to form a stop for avoiding movement of the retractable locating frame with respect to the base, the spacing between the base and the retractable locating frame can be thus kept and the electronic device mounted on the test socket can be secured.
申请公布号 US2005142901(A1) 申请公布日期 2005.06.30
申请号 US20040886597 申请日期 2004.07.09
申请人 VIA TECHNOLOGIES, INC. 发明人 WANG D. H.
分类号 H01R12/00;H05K7/10;H05K7/12;(IPC1-7):H01R12/00 主分类号 H01R12/00
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