发明名称 Method for forming copper wiring of semiconductor device
摘要 The method for forming the copper wiring of the semiconductor device includes the steps of forming a first copper wiring on a semiconductor substrate having a predetermined low structure, implanting magnesium ion on the first copper wiring, forming a magnesium oxide layer on the first copper wiring by thermal treating the first copper wiring, and forming a second copper wiring on the magnesium oxide layer.
申请公布号 US2005140012(A1) 申请公布日期 2005.06.30
申请号 US20040026927 申请日期 2004.12.30
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 JUNG BYUNG-HYUN
分类号 H01L21/28;H01L21/4763;H01L21/768;H01L23/48;H01L23/52;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/28
代理机构 代理人
主权项
地址