发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent a malfunction due to an error signal which is generated in level shift circuits. SOLUTION: An error signal detection circuit 3 is connected to a level shift circuit part 2 in parallel, and includes a constitution being the same as that of the two level shift circuits for ON and OFF which are arranged in the level shift circuit part 2, excluding that HVMOS 32 is a dummy switching element which is fixed to OFF in a normal usage state. The voltage lowering of a resister for detecting an error signal 31 is input to a malfunction preventing circuit 4 via a NOT gate 35 as an error signal generation signal SD indicating the generation of the error signal in the level shift circuit part 2. The malfunction preventing circuit 4 performs a prescribed processing to prevent the malfunction in response to the error signal generation signal SD. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005176174(A) 申请公布日期 2005.06.30
申请号 JP20030416164 申请日期 2003.12.15
申请人 MITSUBISHI ELECTRIC CORP 发明人 ORITA SHOICHI
分类号 H01L27/04;G06F11/00;H01L21/822;H02M1/08;H03K17/0812;H03K17/16;H03K19/00;H03K19/0175;H03K19/0185;(IPC1-7):H03K19/017;H03K19/018 主分类号 H01L27/04
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