发明名称 DECOUPLING CAPACITOR AND SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a decoupling capacitor which can control a capacity value and a leakage current, and which has sufficient responsibility. SOLUTION: VSS 302 is given to the gate 304 of a MOS transistor constituting the decoupling capacitor. VDD 301 is given to a source 305 and a drain 306. NWVDD 303 of potential differs from the source 305 and the drain 306, and is given to a substrate 307. When NWVDD 303 is set to be higher than VDD 301, a depletion layer 309 is widen, and leakage current can be reduced instead of reducing capacity of the decoupling capacitor. When NWVDD 303 is set to be lower than VDD 301 to a degree that latch-up does no occur, the depletion layer 309 becomes small and capacity of the decoupling capacitor can be increased. The capacity value and the leakage current value of the decoupling capacitor are controllable by changing potential NWVDD 303 given to the substrate 307. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005175003(A) 申请公布日期 2005.06.30
申请号 JP20030409173 申请日期 2003.12.08
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TSUTSUMI MASANORI;YANO JUNICHI
分类号 H01L27/04;G11C5/02;H01L21/765;H01L21/82;H01L21/822;H01L21/8234;H01L27/06;H01L27/08;H01L27/088;H01L27/118;(IPC1-7):H01L21/82;H01L21/823 主分类号 H01L27/04
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