发明名称 Wafer protection device
摘要 A wafer protection device. The wafer has a first surface etched with an etching fluid and a second surface, and the wafer protection device is applied to the wafer to prevent a specific area on the second surface of the wafer from etching. The wafer protection device has a body and a pressure modulating device. The body covers the specific area of the wafer and provides an isolated cavity between the body and the specific area to prevent the specific area from contacting the etching fluid, and the pressure modulating device is provided on the body and connected to the isolated cavity to modulate pressure in the isolated cavity.
申请公布号 US2005139939(A1) 申请公布日期 2005.06.30
申请号 US20040021298 申请日期 2004.12.22
申请人 BENO CORPORATION 发明人 HU HUNG-SHENG;CHEN WEI-LIN
分类号 B44C1/22;B81C1/00;C03C15/00;C03C25/68;C23F1/00;H01L21/00;H01L21/306;H01L21/68;H01L27/14;H01L29/82;H01L29/84;(IPC1-7):H01L21/00 主分类号 B44C1/22
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