发明名称 Automatic exchange of degraders in accelerated testing of computer chips
摘要 Issues that are addressed in accordance with at least one presently preferred embodiment of the present invention, are: improvements upon the time it takes to physically swap degraders (done previously by hand); the safety involved in doing so, since the degraders become highly radioactive; possible improved energy resolution and beam stability if the accelerator can be left running continuously; and in-situ monitoring of beam current, beam position and stability. Particularly contemplated are methods and arrangements for changing degraders automatically, not manually, and in a safe manner.
申请公布号 US2005143945(A1) 申请公布日期 2005.06.30
申请号 US20030734694 申请日期 2003.12.12
申请人 IBM CORPORATION 发明人 BOHNENKAMP CARL E.;CANNON ETHAN H.;CASCIO ETHAN W.;GORDON MICHAEL S.;RODBELL KENNETH P.;ZABEL THEODORE H.
分类号 G06F19/00;(IPC1-7):G06F19/00 主分类号 G06F19/00
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