发明名称 SUBSTRATE VISUAL INSPECTION APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate visual inspection apparatus capable of precise and efficient inspection by appropriately using a character collation method and a pattern matching method. <P>SOLUTION: The substrate visual inspection apparatus images each component packaged on a substrate by a part packaging machine, and performs an inspection on whether each part is appropriately packaged, based on images. For this sort of substrate visual inspection apparatus, a character collation inspection system 2 for determining whether the part concerned is conforming by comparing characters printed on the part is provided, and a pattern matching inspection system 3 for determining whether the packaged state of the part is conforming by pattern matching, based on a template created in advance for the shape of the part, or the like is provided, thus using the character collation inspection system and the pattern matching inspection system according to the condition of inspection. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005172499(A) 申请公布日期 2005.06.30
申请号 JP20030410154 申请日期 2003.12.09
申请人 HITACHI LTD;HITACHI INFORMATION & CONTROL SYSTEMS INC 发明人 HIRAKAWA HIROKAZU;HIRUTA TETSUO;TAJIMA ATSUYA
分类号 G01B11/24;G01N21/956;G06K9/34;G06T1/00;H05K13/08 主分类号 G01B11/24
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