发明名称 SAMPLE THERMOSTAT DEVICE AND AUTOMATIC SAMPLER USING IT
摘要 PROBLEM TO BE SOLVED: To provide a thermostat device for correcting temperature unevenness at the sample cooling time. SOLUTION: The bottom surface 24 of a sample rack 2 is placed on a cooling part 14. The cooling part 14 has a Peltier element 16 as an electronic cooling element, and the first cooling plate 18 is provided adhesively on one surface of the Peltier element 16, and the second cooling plate 10 is additionally provided adhesively on the cooling plate 18. A heat insulating material 22 is buried into the center part on the surface of the cooling plate 10. Since the heat insulating material 22 is buried into the center part of the contact face between the cooling plate 10 provided on the Peltier element 16 through the cooling plate 18 and the bottom surface 24 of the sample rack as a heat insulating layer, supercooling at a part close to the Peltier element 16 is prevented. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005172639(A) 申请公布日期 2005.06.30
申请号 JP20030413868 申请日期 2003.12.11
申请人 SHIMADZU CORP 发明人 UCHIDA TAKASHI
分类号 G01N1/28;G01N30/24;G01N35/00;G01N35/10;(IPC1-7):G01N1/28 主分类号 G01N1/28
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