发明名称 LOCAL REDUCTION IN LAYER THICKNESS OF COMPLIANT THERMALLY CONDUCTIVE MATERIAL ON CHIP
摘要 <P>PROBLEM TO BE SOLVED: To reduce the temperature of a hot spot of a chip by locally reducing the layer thickness of a compliant thermally conductive material on the chip. <P>SOLUTION: In an integrated circuit package structure within MCM or SCM, a compliant thermally conductive material is applied between a heat-producing integrated circuit and a substrate attached thereto. A thinner layer of the compliant thermally conductive material is arranged between the chip and the substrate in this region after assembling, and as a result, a raised region aligned to a high power density region higher than the average on the active front surface of the chip is defined at the backside of the chip so that the temperature of the "hot spot" on the chip is reduced. In an exemplary embodiment, the substrate comprises one of a heat sink, cooling plate, heat spreader, heat pipe, heat hat, package lid, and other cooling members. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005175483(A) 申请公布日期 2005.06.30
申请号 JP20040353571 申请日期 2004.12.07
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 COLGAN EVAN G;FEGER CLAUDIS;GOTH GARY F;KATOPIS GEORGE A;MAGERLEIN JOHN H;SPROGIS EDMUND J
分类号 H01L23/34;H01L21/50;H01L21/56;H01L23/10;H01L23/12;H01L23/36;H01L23/367;H01L23/373 主分类号 H01L23/34
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