Method and system for testing a logic design

摘要

A method of testing a logic design in one disclosed embodiment includes identifying a plurality of clocked logic elements of a first logic design. The plurality of logic elements is subdivided into M individual groups of elements. A distinct pseudo-clock is assigned to each of the M groups such that each of the M groups of logic elements is associated with a distinct clock domain in a second logic design. A simulation is performed on the second logic design with the M pseudo-clocks.