发明名称 |
DOPING METHOD AND SEMICONDUCTOR ELEMENT USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a doping method that achieves shallow junctions of source and drain and has no scattering of element characteristics, and to provide a semiconductor element using the doping method. SOLUTION: By having either fullerene derivative molecules or metallocene molecules, having larger electron affinity or smaller ionization energy adhered to the surface of a semiconductor, charge transfer from the molecule to the semiconductor is induced, and doping of the semiconductor is carried out. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005175254(A) |
申请公布日期 |
2005.06.30 |
申请号 |
JP20030414550 |
申请日期 |
2003.12.12 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY;NEC CORP |
发明人 |
TADA TETSUYA;KANAYAMA TOSHIHIKO;HIURA HIDEFUMI |
分类号 |
H01L27/10;H01L21/329;H01L21/336;H01L21/8247;H01L27/115;H01L29/08;H01L29/66;H01L29/78;H01L29/788;H01L29/792;H01L29/861;H01L51/30;(IPC1-7):H01L21/336;H01L21/824 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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