发明名称 DOPING METHOD AND SEMICONDUCTOR ELEMENT USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a doping method that achieves shallow junctions of source and drain and has no scattering of element characteristics, and to provide a semiconductor element using the doping method. SOLUTION: By having either fullerene derivative molecules or metallocene molecules, having larger electron affinity or smaller ionization energy adhered to the surface of a semiconductor, charge transfer from the molecule to the semiconductor is induced, and doping of the semiconductor is carried out. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005175254(A) 申请公布日期 2005.06.30
申请号 JP20030414550 申请日期 2003.12.12
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY;NEC CORP 发明人 TADA TETSUYA;KANAYAMA TOSHIHIKO;HIURA HIDEFUMI
分类号 H01L27/10;H01L21/329;H01L21/336;H01L21/8247;H01L27/115;H01L29/08;H01L29/66;H01L29/78;H01L29/788;H01L29/792;H01L29/861;H01L51/30;(IPC1-7):H01L21/336;H01L21/824 主分类号 H01L27/10
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