发明名称 |
METHOD FOR FORMING INTERCONNECT LINE USING DAMASCENE METHOD, AND COATING LIQUID FORMING SILICA BASED COATING FOR USE IN FORMATION OF INTERCONNECT LINE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for forming an interconnect line by damascene method in which the interconnect line has mechanical strength suitable for damascene method and a fabricated integrated circuit exhibits excellent dielectric characteristics. SOLUTION: As an etching stopper layer 25 being provided between interconnect line forming layers 24 (interlayer insulating film layers) or a hard mask layer 23 for protecting the surface of the interconnect line forming layers 24, a silica based coating being formed using coating liquid containing a hydrolysis product of trialkoxy silane is employed. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005175394(A) |
申请公布日期 |
2005.06.30 |
申请号 |
JP20030417017 |
申请日期 |
2003.12.15 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
TAKAHAMA AKIRA;SAKAMOTO YOSHIKANE;IIDA HIROYUKI;FUJII YASUSHI |
分类号 |
H01L21/768;H01L21/316;(IPC1-7):H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
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