发明名称 |
Method for fabricating flash memory device |
摘要 |
A flash memory device fabrication method is disclosed. A disclosed method comprises: depositing a first oxide layer on a substrate; depositing a first polysilicon layer on the first oxide layer; forming a second oxide layer on the entire surface of the first polysilicon layer; removing the second oxide layer; making the first polysilicon layer with an embossed shape by performing a heat treatment; depositing a dielectric layer on the top of the first polysilicon layer; depositing a second polysilicon layer on the entire surface of the dielectric layer; and removing some parts of the dielectric layer and the second polysilicon layer through a patterning process and an etching process.
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申请公布号 |
US2005142752(A1) |
申请公布日期 |
2005.06.30 |
申请号 |
US20040026610 |
申请日期 |
2004.12.30 |
申请人 |
DONGBUANAM SEMICONDUCTOR INC. |
发明人 |
OH SANG H. |
分类号 |
H01L21/8247;H01L21/28;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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