Method and apparatus for identifying pathology in brain images

摘要

A method and apparatus for identifying pathology in a brain image comprises the steps of firstly determining the location of the midsagittal plane (MSP) of the brain illustrated in the image under examination by identifying the symmetry of the two hemispheres based on the determination of up to 16 approximated fissure line segments (AFLSs). Those AFLSs with a larger angular deviation from the MSP than a predefined threshold are considered as outlier AFLSs while the rest are taken as inlier AFLSs. The ratio of the number of the outlier AFLSs to the number of inlier AFLSs is then calculated. A comparison of the ratio with a further predetermined threshold value is made and if the ratio exceeds the further predetermined threshold value, pathology is present in the brain image.