发明名称 Method for depositing thin film using plasma chemical vapor deposition
摘要 A thin film deposition method using plasma enhanced chemical vapor deposition is described. In a plasma enhanced chemical vapor deposition chamber, plasma is used to enhance the chemical reaction to form a thin film on a substrate. The substrate is then removed, followed by passing a cleaning gas into the chamber to remove residues in the chamber. Before loading another batch of substrate in the chamber, a pre-deposition process is performed to isolate contaminants generated from the cleaning process. A discharge plasma treatment is then conducted to lower the amount of accumulated electrical charges.
申请公布号 US6911233(B2) 申请公布日期 2005.06.28
申请号 US20020064703 申请日期 2002.08.08
申请人 TOPPOLY OPTOELECTRONICS CORP. 发明人 LIN FRANK
分类号 C23C16/44;(IPC1-7):C23C16/56 主分类号 C23C16/44
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