发明名称 |
Contact spring and socket combination for high bandwidth probe tips |
摘要 |
A high-bandwidth electrical test probe having a probe contact spring of reduced size and characteristic capacitance is presented. The probe includes a contact spring connected at one end to the input port of a probe circuit. The opposite end of the contact spring enters the a probe socket and a predetermined angle of entry. The probe socket has a bore formed therein which is arranged at a non-zero angle relative to the angle of entry of the contact spring into said probe socket bore, thereby guaranteeing electrical contact with the bore. The design allows the use of a very small contact spring, on the order of tens of mils, thereby reducing the parasitic capacitance of the spring and allowing much higher bandwidths than heretofore achievable.
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申请公布号 |
US6911811(B2) |
申请公布日期 |
2005.06.28 |
申请号 |
US20020100677 |
申请日期 |
2002.03.18 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
CANNON JAMES EDWARD |
分类号 |
G01R1/067;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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