发明名称 Methods for fabricating MRAM device structures
摘要 A method for fabricating a magnetic memory element structure comprises providing a dielectric layer having a conducting via. A first magnetic layer is formed overlying the dielectric layer and is in electrical communication with the conducting via. A non-magnetic layer and a second magnetic layer are formed overlying the first magnetic layer. A first conductive layer is deposited overlying the second magnetic layer and is patterned. A portion of the second magnetic layer is exposed and is transformed to form an inactive portion and an active portion. The active portion comprises a portion of a memory element and the inactive portion comprises an insulator. A sidewall spacer is formed about at least one sidewall of the first conductive layer and a masking tab is formed that overlies a portion of the memory element and extends to overlie at least a portion of the conducting via.
申请公布号 US6911156(B2) 申请公布日期 2005.06.28
申请号 US20030417537 申请日期 2003.04.16
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 GRYNKEWICH GREGORY W.;BUTCHER BRIAN R.;DURLAM MARK A.;KYLER KELLY;SMITH KENNETH H.;TRACY CLARENCE J.
分类号 G11B5/127;G11C11/16;H01L21/00;H01L43/12;H04R31/00;H05K3/02;(IPC1-7):H01L21/00 主分类号 G11B5/127
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