APPARATUS AND METHOD FOR ANALYZING CHARACTERISTIC OF MAGNETIC RAM

摘要

PROBLEM TO BE SOLVED: To provide an MRAM characteristic analyzing apparatus and method which can analyze characteristics of respective unit cells of an MRAM array with a relatively simple configuration within a short period of time. SOLUTION: The MRAM characteristic analyzing apparatus includes: an MRAM placing section on which an MRAM is to be mounted; a magnetic field applying section which is formed around the MRAM placing section and is used to apply external magnetic field to the MRAM mounted on the MRAM placing section, a probe card which is formed on the top of the place corresponding to the MRAM placing section; a matrix switch which is used to specify an MRAM unit cell; a source measurement unit which is used to apply internal magnetic field to the MRAM unit cell or is used to measure a resistive value of the unit cell; and an analysis unit which is used to store information related to the resistive values of the MRAM unit cells measured and to analyze the information. COPYRIGHT: (C)2005,JPO&NCIPI