发明名称 Method for forming a box shaped polygate
摘要 A method for forming an improved etching hardmask oxide layer in a polysilicon etching process including providing a planarized semiconductor wafer process surface including adjacent first exposed polysilicon portions and exposed oxide portions; selectively etching through a thickness portion of the exposed oxide portions; thermally growing an oxide hardmask layer over the exposed polysilicon portions to form oxide hardmask portions; exposing second exposed polysilicon portions adjacent at least one oxide hardmask portion; and, etching through a thickness portion of the second exposed polysilicon portions.
申请公布号 US2005133850(A1) 申请公布日期 2005.06.23
申请号 US20050051845 申请日期 2005.02.03
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHANG YI-SHING;TU YEUR-LUEN;TSAI CHIA-SHIUNG;CHU WEN-TING
分类号 H01L21/8247;H01L27/115;H01L29/423;(IPC1-7):H01L29/76;H01L21/320;H01L21/461 主分类号 H01L21/8247
代理机构 代理人
主权项
地址