发明名称 Metal interconnection structure of semiconductor device and method of forming the same
摘要 Provided is a metal interconnection structure of a semiconductor device, having: a lower metal layer disposed on an insulating layer formed on a semiconductor device; a contact plug disposed on the lower metal layer; a supporting layer disposed to surround the contact plug; an upper metal layer disposed on the contact plug and the supporting layer; and an air layer interposed between the lower and upper metal layers to insulate the lower metal layer from the upper metal layer.
申请公布号 US2005136651(A1) 申请公布日期 2005.06.23
申请号 US20040019267 申请日期 2004.12.23
申请人 DONGBUANAM SEMICONDUCTOR, INC. 发明人 KIM SANG K.
分类号 H01L21/28;H01L21/4763;H01L21/768;H01L23/48;H01L23/522;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/28
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