发明名称 ELECTRODE, METHOD FOR PRODUCING SAME AND SEMICONDUCTOR DEVICE USING SAME
摘要 <p>Disclosed is a technology for obtaining an electrode which has a low contact resistance and less surface roughness. Specifically disclosed is an electrode formed on top of a semiconductor film (101) which is characterized in that the electrode comprises a first metal layer (102) and a second metal layer (103) sequentially formed on top of the semiconductor film (101) in this order, and the first metal layer (102) is composed of Al while the second metal film (103) is composed of one or more metals selected from the group consisting of Nb, W, Fe, Hf, Re, Ta and Zr.</p>
申请公布号 WO2005057641(A1) 申请公布日期 2005.06.23
申请号 WO2004JP18140 申请日期 2004.12.06
申请人 NEC CORPORATION;NAKAYAMA, TATSUO;MIYAMOTO, HIRONOBU;ANDO, YUJI;INOUE, TAKASHI;OKAMOTO, YASUHIRO;KUZUHARA, MASAAKI 发明人 NAKAYAMA, TATSUO;MIYAMOTO, HIRONOBU;ANDO, YUJI;INOUE, TAKASHI;OKAMOTO, YASUHIRO;KUZUHARA, MASAAKI
分类号 H01L21/28;H01L29/20;H01L29/45;(IPC1-7):H01L21/28;H01L29/417;H01S5/042;H01L33/00;H01L29/778 主分类号 H01L21/28
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