发明名称 GARIUM/INDIUM/NITROGEN/ARSENIC SERIES SEMICONDUCTOR LASER
摘要 PROBLEM TO BE SOLVED: To improve an element lifetime and a production yield of a GaInNAs series semiconductor laser. SOLUTION: A GaAs intermediate layer (layer thickness 2 nm) 12 is inserted between a Ga<SB>0.6</SB>In<SB>0.4</SB>N<SB>0.005</SB>As<SB>0.995</SB>well layer 13 (layer thickness 5 nm) and a GaN<SB>0.01</SB>As<SB>0.99</SB>stress compensation layer (layer thickness 5 nm) 11, whereby a difference in an amount of distortion at a hetero interface is reduced, to manufacture a distortion compensation quantum well active layer 4 having an excellent hetero interface. As the material of the intermediate layer, GaAs, GaAsSb and GaInAs are preferable. If the amount of distortion of the intermediate layer is so large, this is counter to a stress compensation. Therefore, a range of 0 to 0.5% is preferable. If the thickness of the intermediate layer is so thin, an effect of insertion disappears. On the contrary, even if the thickness is excessive, an effect of compensation is reduced. Therefore, an optimum range exists. The thickness of the intermediate layer is 0.5 to 2.5 nm, preferably. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005166921(A) 申请公布日期 2005.06.23
申请号 JP20030403176 申请日期 2003.12.02
申请人 HITACHI LTD 发明人 KONDO MASAHIKO
分类号 H01S5/343;(IPC1-7):H01S5/343 主分类号 H01S5/343
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