发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device having a good characteristic, such as characteristic of material, where crystals of excellent quality can be uniformly grown on a large substrate whose lattice is irregular. <P>SOLUTION: The semiconductor device is deposited on the substrate having a surface orientation of an angle of 0.05&deg;or more different from a (0001) surface of GaN or AlN. Especially, in the case of Gan, the light emitting efficiency is abruptly improved at an off-angle of 0.5&deg; or more. Its temperature characteristic can be improved by using the AlN substrate having almost 5 times as large heat transfer rate as sapphire. Moreover, locating a quantum well structure between the substrate and the light emitting layer allows preventing a transition from spreading to an active layer, thereby, the characteristic can be improved. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005167194(A) 申请公布日期 2005.06.23
申请号 JP20040234855 申请日期 2004.08.11
申请人 TOSHIBA CORP 发明人 KUSHIBE MITSUHIRO;FUJIMOTO HIDETOSHI
分类号 C23C16/02;H01L21/20;H01L21/338;H01L29/778;H01L29/812;H01L33/32;H01S5/323 主分类号 C23C16/02
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