Semiconductor integrated circuit

摘要

A semiconductor integrated circuit has a plurality of signal paths and a plurality of scan separation circuits. Each scan separation circuit is provided on each signal path. Each scan separation includes a first selector and a second selector. The semiconductor integrated circuit also includes a first circuit block and a second circuit block. The first selector switches between a signal from the first circuit block and an output signal from a flip-flop provided in the scan separation circuit, and supplies the selected signal to the second circuit block. The selected signal is also supplied to the second selector. The second selector selects the signal from the first selector or a signal from outside (or a test signal supplied from an earlier-stage scan separation circuit). The output of the second selector is connected to a flip-flop. The test signal held by the flip-flop is supplied to the first selector and to a subsequent-stage scan separation circuit. During a test, signal paths between the first and second circuit blocks can be tested because the signal from the first circuit block is supplied to and held in the flip-flop via the first and second selectors.