发明名称 Film-formation method for semiconductor process
摘要 A film-formation method for a semiconductor process includes pre-coating of covering a worktable with a pre-coat before loading a target substrate into a process chamber, and film formation thereafter of loading the target substrate into the process chamber, and forming a main film on the target substrate. The pre-coating repeats the first and second steps a plurality of times, thereby laminating segment films to form the pre-coat. The first step supplies first and second process gases into the process chamber, thereby forming a segment film containing a metal element on the worktable. The second step supplies the second process gas containing no metal element into the process chamber, thereby exhausting and removing, from the process chamber, a byproduct produced in the first step other than a component forming the segment film.
申请公布号 US2005136657(A1) 申请公布日期 2005.06.23
申请号 US20050033406 申请日期 2005.01.12
申请人 TOKYO ELECTRON LIMITED 发明人 YOKOI HIROAKI;ZENKO TETSU;ASHIZAWA HIROAKI;HASHIMOTO TSUYOSHI
分类号 C23C16/34;C23C16/44;H01L21/44;(IPC1-7):H01L21/44 主分类号 C23C16/34
代理机构 代理人
主权项
地址