发明名称 MOS TRANSISTOR AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a MOS transistor for applying a self-alignment contact process while reducing the sheet resistance and contact resistance of source/drain regions. SOLUTION: Partial conductive stopper films 8F, 8G made of a WSix film are formed at a region in which it is predicted that a displacement in overlapping of a contact hole 16 occurs on a field oxide film 2 and an LDD sidewall 6 both made of silicon oxide, and a TiSix film 11 is formed on the surface of the source/drain regions 7 at the middle of the stopper films 8F, 8G for reducing sheet resistance. Even if the bottom surface of the contact hole 16 is hung on the field oxide film 2 and the LDD sidewall 6, no holes are open in the insulating films by the stopper films 8F, 8G, and the stopper films 8F, 8G function as source/drain retrieve electrodes, thus reducing contact resistance. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005167279(A) 申请公布日期 2005.06.23
申请号 JP20050020282 申请日期 2005.01.27
申请人 SONY CORP 发明人 SUMI HIROBUMI
分类号 H01L21/28;H01L21/336;H01L21/768;H01L29/417;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/28
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