发明名称 Semiconductor device having two different operation modes employing an asymmetrical buried insulating layer and method for fabricating the same
摘要 According to some embodiments, a semiconductor device includes a lower semiconductor substrate, an upper silicon pattern, and a MOS transistor. The MOS transistor includes a body region formed within the upper silicon pattern and source/drain regions separated by the body region. A buried insulating layer is interposed between the lower semiconductor substrate and the upper silicon pattern. A through plug penetrates the buried insulating layer and electrically connects the body region with the lower semiconductor substrate, the through plug positioned closer to one of the source/drain regions than the other source/drain region. At least some portion of the upper surface of the through plug is positioned outside a depletion layer when a source voltage is applied to the one of the source/drain regions, and the upper surface of the through plug is positioned inside the depletion layer when a drain voltage is applied to the one region.
申请公布号 US2005133789(A1) 申请公布日期 2005.06.23
申请号 US20040011911 申请日期 2004.12.13
申请人 OH CHANG-WOO;PARK DONG-GUN;LEE SUNG-YOUNG;CHOE JEONG-DONG 发明人 OH CHANG-WOO;PARK DONG-GUN;LEE SUNG-YOUNG;CHOE JEONG-DONG
分类号 H01L21/76;H01L21/336;H01L21/762;H01L21/8242;H01L27/02;H01L27/108;H01L29/76;H01L29/78;H01L29/786;(IPC1-7):H01L29/76 主分类号 H01L21/76
代理机构 代理人
主权项
地址