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发明名称
A system for measuring the lattice spacing of a crystal by means of x-rays
摘要
申请公布号
GB936910(A)
申请公布日期
1963.09.18
申请号
GB19590043594
申请日期
1959.12.22
申请人
RIGAKU DENKI COMPANY LIMITED
发明人
SHIMULA YOSHIHIRO;UCHIDA HIROSHI
分类号
G01N23/205
主分类号
G01N23/205
代理机构
代理人
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地址
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