| 摘要 |
PROBLEM TO BE SOLVED: To provide a thermal lens microscopic detector constituted so as to facilitate the adjustment of a probe light optical system and an exciting light optical system by dispensing with the axial alignment of probe light P and exciting light E. SOLUTION: This thermal lens microscopic detector 10 includes the exciting light optical system for allowing exciting light E to enter the fine region of a specimen to induce a thermal lens, the probe light optical system for allowing probe light P to enter the produced thermal lens region and a detector 17 for detecting the probe light P transmitted through the thermal lens region. Fundamental wave light and higher harmonic light caused by a wavelength transducing laser using a wavelength transducer 12 are used as the exciting light E and the probe light P to coaxially emit both lights from the wavelength transducer. COPYRIGHT: (C)2005,JPO&NCIPI
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