发明名称 Methods of forming shallow trench isolation
摘要 A method of forming a shallow trench isolation is disclosed. An example method of forming a shallow trench isolation performs a planarization process for a substrate on which a hard mask and an insulation layer are formed, selectively etching the insulation layer on the edge of the substrate by using wet etch equipment, and performs a main etching process in the center region of the substrate.
申请公布号 US2005136614(A1) 申请公布日期 2005.06.23
申请号 US20040021803 申请日期 2004.12.23
申请人 YIM TERESA 发明人 YIM TERESA
分类号 H01L21/311;H01L21/762;(IPC1-7):H01L21/76;H01L21/302;H01L21/461 主分类号 H01L21/311
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