发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device wherein the circumferential length of an opening can be increased without changing a ratio of area of a cell occupied by patterns and the mechanical strength of a cylinder inside the cell can also be increased, and to provide its manufacturing method. <P>SOLUTION: By forming a slit 10b wherein a wafer is not opened at the center of the pattern, a resist shape image 11, that is, the shape of the opening of the wafer is nearly a cocoon-like one having a constriction at the center, resulting in an increase in circumferential length of the opening without changing the ratio of area of the cell occupied by the patterns. Moreover, since the bottom face of the opening also has nearly a cocoon-like shape having a constriction at the center, the mechanical strength of the opening can be increased. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005166727(A) 申请公布日期 2005.06.23
申请号 JP20030399996 申请日期 2003.11.28
申请人 ELPIDA MEMORY INC 发明人 HIROSHIMA MASAHITO;NISHIDA TAKASHI
分类号 G03F1/00;G03F1/68;H01L21/02;H01L21/027;H01L21/20;H01L21/8242;H01L27/108;H01L29/73 主分类号 G03F1/00
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