发明名称 |
ABIST-assisted detection of scan chain defects |
摘要 |
An apparatus, program product and method utilize an ABIST circuit provided on an integrated circuit device to assist in the identification and location of defects in a scan chain that is also provided on the integrated circuit device. In particular, a defect in a scan chain may be detected by applying a plurality of pattern sets to a scan chain coupled to an ABIST circuit, collecting scan out data generated as a result of the application of the plurality of pattern sets to the scan chain, and using the collected scan out data to identify a defective latch in the scan chain.
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申请公布号 |
US2005138514(A1) |
申请公布日期 |
2005.06.23 |
申请号 |
US20030728348 |
申请日期 |
2003.12.04 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BURDINE TODD M.;FORLENZA DONATO O.;FORLENZA ORAZIO P.;HURLEY WILLIAM J.;MICHNOWSKI STEVEN;WEBB JAMES B. |
分类号 |
G01R31/3185;(IPC1-7):G11B5/00;G01R31/28;G06K5/04;G11B20/20 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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