| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To actualize an electron beam generator for performing accurate high-bandwidth sampling and a sampler using the same generator. <P>SOLUTION: This sampler is equipped with a device for generating an electron beam by irradiating a light signal to a negative-electrode cathode, a deflecting electrode for deflecting a generated electron beam, a sampling slit for partly transmitting the deflected electron beam, and an electric charge detection means for detecting the amount of electric charge (or integrated current) of the transmitted electron beam. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
