发明名称 IMPACT TESTING MACHINE
摘要 PROBLEM TO BE SOLVED: To provide an impact testing machine for easily, efficiently and surely setting and removing a test piece, in comparison with the conventional testing machines. SOLUTION: A guide groove is disposed on a side face of a test piece support plate 31 for supporting the test piece. A guide pin 30 is fixed to a pair of guide members 29 and is engaged with the guide groove. The test piece support plate 31 is inserted to a placing plate of a test piece placing table 8 by the guide members 29 is a pull-out manner. When the test piece and the test piece support plate 31 are positioned at a predetermined test position, engagement of the guide pin 30 and the guide groove is released. The plate test piece TP; placed on the test piece placing table, is pressed by a pressing plate 23, and impact is given to the test piece TP by a test jig. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005164542(A) 申请公布日期 2005.06.23
申请号 JP20030407518 申请日期 2003.12.05
申请人 SHIMADZU CORP 发明人 TAKII TADAOKI
分类号 G01N3/30;(IPC1-7):G01N3/30 主分类号 G01N3/30
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