发明名称 |
METHOD FOR MANUFACTURING COMPOUND SEMICONDUCTOR WAFER AND COMPOUND SEMICONDUCTOR DEVICE |
摘要 |
A method for manufacturing a compound semiconductor wafer for the use in HBT production, in which a sub- collector layer, a collector layer, a base layer and an emitter layer are vapor-deposited in this order on a compound semiconductor substrate through an MOCVD method; wherein the base layer is a p-type compound semiconductor thin film layer containing at least one of Ga, Al and In as a Group III element and As as a Group V element under the condition that the growth is the Group V gas flow-rate supply rate-determining growth.
|
申请公布号 |
KR20050060064(A) |
申请公布日期 |
2005.06.21 |
申请号 |
KR20057002270 |
申请日期 |
2003.08.01 |
申请人 |
SUMITOMO CHEMICAL CO., LTD.;SUMIKA EPI SOLUTION COMPANY, LTD. |
发明人 |
YAMADA HISASHI;FUKUHARA NOBORU |
分类号 |
H01L21/205;H01L21/331;H01L29/737;(IPC1-7):H01L29/737 |
主分类号 |
H01L21/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|