发明名称 METHOD FOR MANUFACTURING COMPOUND SEMICONDUCTOR WAFER AND COMPOUND SEMICONDUCTOR DEVICE
摘要 A method for manufacturing a compound semiconductor wafer for the use in HBT production, in which a sub- collector layer, a collector layer, a base layer and an emitter layer are vapor-deposited in this order on a compound semiconductor substrate through an MOCVD method; wherein the base layer is a p-type compound semiconductor thin film layer containing at least one of Ga, Al and In as a Group III element and As as a Group V element under the condition that the growth is the Group V gas flow-rate supply rate-determining growth.
申请公布号 KR20050060064(A) 申请公布日期 2005.06.21
申请号 KR20057002270 申请日期 2003.08.01
申请人 SUMITOMO CHEMICAL CO., LTD.;SUMIKA EPI SOLUTION COMPANY, LTD. 发明人 YAMADA HISASHI;FUKUHARA NOBORU
分类号 H01L21/205;H01L21/331;H01L29/737;(IPC1-7):H01L29/737 主分类号 H01L21/205
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