发明名称 EXPOSURE TRANSFER MASK AND EXPOSURE TRANSFER MASK PATTERN EXCHANGE METHOD
摘要 An exposure transfer mask includes a mask section having a plurality of cells on each of which an opening of a predetermined pattern is formed. When a charged particle beam is applied to one side of the cells, the charged particle beam is transmitted to the other side of the cells according to the pattern of the opening formed on the cells. When a substrate to be processed is arranged at the other side of the cells, the opening pattern of the cells is transferred to the substrate to be processed so that an exposure pattern is formed on the substrate to be processed. In the aforementioned mask section, some or all of the plurality of cells can be exchanged.
申请公布号 KR20050060060(A) 申请公布日期 2005.06.21
申请号 KR20057000553 申请日期 2005.01.11
申请人 OCTEC INC.;TOKYO ELECTRON LIMITED 发明人 OKUMURA KATSUYA;NAGASEKI KAZUYA;SATOH NAOYUKI
分类号 G03F1/20;G03F7/20;H01J37/317;H01L21/027 主分类号 G03F1/20
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