发明名称 Semiconductor device with dummy structure
摘要 A semiconductor device having: a semiconductor substrate with an isolation region defining a plurality of active regions; a gate electrode formed above each active region, constituting a semiconductor element; an interlevel insulator covering the gate electrode; local interconnects formed through the interlevel insulator and electrically connected to the semiconductor element; local interconnect dummies formed through the interlevel insulator and electrically separated from the local interconnects; and lower level dummies, each comprising either one of an active region dummy, a laminated dummy of an active region dummy and a gate electrode dummy formed thereon, and a gate electrode dummy formed on the isolation region, wherein each of the local interconnect dummies is not connected to two or more lower level dummies.
申请公布号 US6909189(B2) 申请公布日期 2005.06.21
申请号 US20030696038 申请日期 2003.10.30
申请人 FUJITSU LIMITED 发明人 NANJO RYOTA
分类号 H01L21/76;H01L21/3105;H01L21/3205;H01L21/762;H01L21/768;H01L21/822;H01L21/8234;H01L23/52;H01L23/522;H01L27/02;H01L27/04;H01L27/08;H01L27/088;(IPC1-7):H01L23/48 主分类号 H01L21/76
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