Memory-module burn-in system with removable pattern-generator boards separated from heat chamber by backplane

摘要

An environmental tester for memory modules has an environmental chamber for heating the memory modules being tested. One side of the chamber is a backplane. The memory modules are inserted into sockets on module motherboards, which are inserted into motherboard sockets on the backplane. On the other side of the backplane, card sockets receive pattern-generator cards that are outside the environmental chamber but electrically connected to the module motherboards through the backplane. The pattern-generator cards contain pattern-generators that generate address, data, and control signals that exercise the memory modules. The pattern-generator cards can be cooled while the memory modules in the environmental chamber are heated. Pattern-generator cards can be removed for repair and module motherboards can be removed for inserting new memory modules for testing.