发明名称 |
FORMING METHOD FOR SILICON OXYNITRIDE FILM |
摘要 |
PROBLEM TO BE SOLVED: To provide a more efficient forming method for a silicon oxynitride film by exploiting respective characteristics of thermal reaction method and plasma excitation method, and further carrying out thermal decomposition of N<SB>2</SB>O gas before irradiating the substrate therewith. SOLUTION: Only N<SB>2</SB>O gas is used as a reactant gas, and the plasma excitation for promoting the nitriding reaction of N<SB>2</SB>O gas and the thermal excitation for promoting the oxidizing reaction of N<SB>2</SB>O gas are controlled independently. The surface of a sample substrate is simultaneously exposed to the reactant gas processed according to respective excitation methods to form the silicon oxynitride film. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005159138(A) |
申请公布日期 |
2005.06.16 |
申请号 |
JP20030397529 |
申请日期 |
2003.11.27 |
申请人 |
TOHOKU TECHNO ARCH CO LTD |
发明人 |
TODA YOSHIHARU;TAKEDA SOUTARO |
分类号 |
H01L21/318;H01L29/78;(IPC1-7):H01L21/318 |
主分类号 |
H01L21/318 |
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