发明名称 Impedance standard substrate and method for calibrating vector network analyzer
摘要 An impedance standard substrate for calibrating a vector network analyzer comprises a first surface and a second surface opposite to the first surface. A thru-circuit has two contacts electrically connected to each other. The two contacts are disposed on the first surface and the second surface, respectively. The impedance standard substrate further comprises a pair of open-circuits, a pair of short-circuits, and a pair of load-circuits disposed on the first surface and the second surface, respectively.
申请公布号 US2005127923(A1) 申请公布日期 2005.06.16
申请号 US20050048840 申请日期 2005.02.03
申请人 ADVANCED SEMICONDUCTOR ENGINEERING, INC. 发明人 WU SUNG M.;CHIU CHI T.
分类号 G01R35/00;(IPC1-7):G01R35/00 主分类号 G01R35/00
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