| 发明名称 |
METHOD FOR TESTING PRECURSOR OF SECONDARY CELL, ITS TESTING INSTRUMENT, AND METHOD FOR MANUFACTURING SECONDARY CELL USING THE METHOD |
| 摘要 |
A method for testing a precursor of a secondary cell with high reliability and high efficiency to judge the precursor to be acceptable or defective. The current flowing when a test voltage is applied between a pair of electrodes is measured before an electrolyte is placed between the electrodes. If a current the current value of which exceeds a predetermined reference current value (13) is detected during the time from the start of application of a voltage to a normal secondary cell precursor until the current becomes constant, the precursor is determined to be defective. |
| 申请公布号 |
KR20050057001(A) |
申请公布日期 |
2005.06.16 |
| 申请号 |
KR20057003363 |
申请日期 |
2005.02.25 |
| 申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
KUME TOSHIRO;SHOJI MASASHI;IGAKI EMIKO;TSUTSUMI SHUJI;SHIMADA MIKINARI;TANAHASHI MASAKAZU;TAKAHASHI AKIRA;IMASHUKU SHOUICHI |
| 分类号 |
G01N27/416;G01R31/36;H01M10/04;H01M10/0525;H01M10/36;H01M10/42;H01M10/44;(IPC1-7):H01M10/04;H01M10/40 |
主分类号 |
G01N27/416 |
| 代理机构 |
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