| 摘要 |
PROBLEM TO BE SOLVED: To precisely test a device to be tested outputting a clock signal, clock inversion signal, and a data signal synchronizing to the clock signal or the clock inversion signal. SOLUTION: The test device comprises a data comparison part for comparing the data signal with a reference voltage; a data variation timing detector part for detecting data variation timing value; a clock comparison part for comparing each of the clock signal and the clock inversion signal with the high side and the low side reference voltages; a clock variation timing detector part for detecting a 1st timing value, a 2nd timing value, a 3rd timing value and a 4th timing value; a cross point detector part for detecting a 5th timing value; and a difference comparison part for discriminating acceptance/rejection of the under testing device based on the difference between the data variation timing value and the 5th timing value. COPYRIGHT: (C)2005,JPO&NCIPI
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