发明名称 Sidewall sealing of porous dielectric materials
摘要 A semiconductor device and method of manufacture thereof. A porous dielectric material is deposited over a workpiece. The porous dielectric material is patterned, and a photosensitive material is spun-on over the patterned porous dielectric material. A portion of the photosensitive material is formed over, and/or soaks into sidewalls of the porous dielectric material pattern, forming a barrier region of photosensitive material. The photosensitive material is developed, leaving the sidewalls of the porous dielectric material pattern sealed by the barrier region of photosensitive material. A liner is deposited over the porous dielectric material, and a conductive material such as copper is used to fill the pattern in the porous dielectric material. Diffusion of copper into the pores of the porous dielectric material is prevented by the barrier region.
申请公布号 US2005127515(A1) 申请公布日期 2005.06.16
申请号 US20030732963 申请日期 2003.12.11
申请人 KNORR ANDREAS;KASTENMEIER BERND 发明人 KNORR ANDREAS;KASTENMEIER BERND
分类号 H01L21/44;H01L21/768;H01L23/48;(IPC1-7):H01L21/44 主分类号 H01L21/44
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