发明名称 POLISHING STATION OF A CHEMICAL MECHANICAL POLISHING MACHINE
摘要 An apparatus for polishing a wafer includes a polishing station having a platen on which a polishing pad is installed, a polishing head having a membrane that contacts a surface of the wafer, the membrane securing the wafer and pressuring the wafer against the polishing pad, wherein the polishing station includes a transfer stage for loading the wafer on or unloading the wafer from the polishing head, and wherein the transfer stage includes a pedestal on which the wafer is placed and a fluid supply part for supplying a fluid into a boundary region between the wafer and the membrane to reduce a surface tension between the wafer and the membrane. Preferably, the apparatus further includes a stopper for preventing the wafer placed on the pedestal from being lifted up along with the membrane when the wafer is unloaded from the polishing head onto the pedestal.
申请公布号 KR100495659(B1) 申请公布日期 2005.06.16
申请号 KR20020034860 申请日期 2002.06.21
申请人 发明人
分类号 H01L21/304;B24B37/04;B24B57/02;H01L21/306;(IPC1-7):H01L21/304 主分类号 H01L21/304
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