发明名称 |
Test device for testing a circuit unit applies a test system, a register device for storing initializing data, a control unit and a switch-on unit |
摘要 |
<p>A circuit unit (101) to be tested has a register device (114), in which initializing data (115) supplied via a storage signal (110) is stored. A control unit (102) controls storage of the initializing data. A switch-on unit (103) switches on the circuit unit to be tested. An independent claim is also included for a method for testing a circuit unit to be tested by means of a test system.</p> |
申请公布号 |
DE10345976(A1) |
申请公布日期 |
2005.06.16 |
申请号 |
DE2003145976 |
申请日期 |
2003.10.02 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
THALMANN, ERWIN |
分类号 |
G11C11/401;G11C29/00;G11C29/14;G11C29/46;(IPC1-7):G11C29/00 |
主分类号 |
G11C11/401 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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