发明名称 Test device for testing a circuit unit applies a test system, a register device for storing initializing data, a control unit and a switch-on unit
摘要 <p>A circuit unit (101) to be tested has a register device (114), in which initializing data (115) supplied via a storage signal (110) is stored. A control unit (102) controls storage of the initializing data. A switch-on unit (103) switches on the circuit unit to be tested. An independent claim is also included for a method for testing a circuit unit to be tested by means of a test system.</p>
申请公布号 DE10345976(A1) 申请公布日期 2005.06.16
申请号 DE2003145976 申请日期 2003.10.02
申请人 INFINEON TECHNOLOGIES AG 发明人 THALMANN, ERWIN
分类号 G11C11/401;G11C29/00;G11C29/14;G11C29/46;(IPC1-7):G11C29/00 主分类号 G11C11/401
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