| 摘要 |
A test device includes a test receptacle from which projects contact elements project and spring contacts that can be electrically contact-connected to the external contacts of an integrated circuit type. Corresponding to the external contact positions of the integrated circuit type, the test device includes module components having at least one electrically conductive contact plate and having an insulating carrier plate, the contact plate being incorporated in cutouts of the carrier plate and having a contact section, a spring section and a holding section.
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