发明名称 METHOD AND ARRANGEMENT FOR OPENING AND CLOSING A TEST CHAMBER DOOR
摘要 In a method and an arrangement for opening and closing a test chamber door, the door (204) is moved using an opening and closing mechanism (206) in the direction (210) of a normal defining the surface of the door opening (200) in front of the door opening (200) so that the door (204) is closed by pressing the door (204) against the frame (202) or opened by lifting off the door (204) from the frame (202). An open door (204) is transferred using a transfer mechanism (208) in a perpendicular direction (212) in relation to the direction (210) of the normal defining the surface of the door opening (200) close to the door opening (200) for closing. The open door (204) is transferred using the transfer mechanism (208) in the perpendicular direction (212) in relation to the direction (210) of the normal defining the surface of the door opening (200) away from the door opening (200) for transferring electronic devices to or from the test chamber.
申请公布号 WO2005054881(A1) 申请公布日期 2005.06.16
申请号 WO2004FI00732 申请日期 2004.12.02
申请人 ELEKTROBIT TESTING OY;TIISMAA, TOOMAS;LINDVEST, STEN 发明人 TIISMAA, TOOMAS;LINDVEST, STEN
分类号 G01R29/08 主分类号 G01R29/08
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