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发明名称
Verfahren zur Analyse von Probenbestandteile tragenden Trägerplatten und Vorrichtungen zur Durchführung dieses Verfahrens
摘要
申请公布号
DE10206548(B4)
申请公布日期
2005.06.16
申请号
DE20021006548
申请日期
2002.02.13
申请人
SIEMENS AG
发明人
ARNDT, FRANK;HOLST, JENS-CHRISTIAN;KRETSCHMER, HANS-RICHARD;ROENSCH, HENDRIK
分类号
B01L3/00;G01N21/25;G01N35/00;(IPC1-7):G01N33/52;G01N1/28;G01N21/63
主分类号
B01L3/00
代理机构
代理人
主权项
地址
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